论文标题

具有超高整流比和超敏感的多层式范德华异质结构

Multilayer InSe-Te van der Waals heterostructures with ultrahigh rectification ratio and ultrasensitive photoresponse

论文作者

Qin, Fanglu, Gao, Feng, Dai, Mingjin, Hu, Yunxia, Yu, Miaomiao, Wang, Lifeng, Hu, PingAn, Feng, Wei

论文摘要

多层范德华(VDWS)半导体在高性能光电设备中具有很大的有希望的应用。但是,基于分层半导体的光电传射电视机通常会遭受大黑色电流和高外部驱动偏置电压的影响。在这里,我们报告了一个由多层硅化(INSE)和泰瑞尔(TELURIUM(TE))组成的垂直范德华异质结构(VDWH)。多层INSE-TE VDWH设备显示出在室温下大于107的创纪录的高正矫正比。此外,VDWHS设备具有超敏感和宽带光响应光电探测器,其超高照片/暗电流比超过104,高检测率为1013,并且在可见的光照射下具有0.45 A/W的可比响应率,并具有弱入射功率。此外,VDWHS设备具有光伏效应,可以充当自动的光电探测器(SPPD)。 SPPD对宽带光谱也非常敏感,范围为300 nm至1000 nm,并且能够检测到弱光信号。这项工作为开发基于多层VDWS结构的下一代电子和光电设备提供了机会。

Multilayer van der Waals (vdWs) semiconductors have great promising application in high-performance optoelectronic devices. However, the photoconductive photodetectors based on layered semiconductors often suffer from large dark current and high external driven bias voltage. Here, we report a vertical van der Waals heterostructures (vdWHs) consisting of multilayer indium selenide (InSe) and tellurium (Te). The multilayer InSe-Te vdWHs device shows a record high forward rectification ratio greater than 107 at room temperature. Furthermore, an ultrasensitive and broadband photoresponse photodetector is achieved by the vdWHs device with an ultrahigh photo/dark current ratio over 104, a high detectivity of 1013, and a comparable responsivity of 0.45 A/W under visible light illumination with weak incident power. Moreover, the vdWHs device has a photovoltaic effect and can function as a self-powered photodetector (SPPD). The SPPD is also ultrasensitive to the broadband spectra ranging from 300 nm to 1000 nm and is capable of detecting weak light signals. This work offers an opportunity to develop next-generation electronic and optoelectronic devices based on multilayer vdWs structures.

扫码加入交流群

加入微信交流群

微信交流群二维码

扫码加入学术交流群,获取更多资源