论文标题

在检测器ND280附近的T2K离轴上的带电电流电子(抗)中微子包含横截面的测量

Measurement of the charged-current electron (anti-)neutrino inclusive cross-sections at the T2K off-axis near detector ND280

论文作者

Abe, K., Akhlaq, N., Akutsu, R., Ali, A., Alt, C., Andreopoulos, C., Anthony, L., Antonova, M., Aoki, S., Ariga, A., Arihara, T., Asada, Y., Ashida, Y., Atkin, E. T., Awataguchi, Y., Ban, S., Barbi, M., Barker, G. J., Barr, G., Barrow, D., Barry, C., Batkiewicz-Kwasniak, M., Beloshapkin, A., Bench, F., Berardi, V., Berns, L., Bhadra, S., Bienstock, S., Blondel, A., Bolognesi, S., Bonus, T., Bourguille, B., Boyd, S. B., Brailsford, D., Bravar, A., Berguño, D. Bravo, Bronner, C., Bron, S., Bubak, A., Avanzini, M. Buizza, Calcutt, J., Campbell, T., Cao, S., Cartwright, S. L., Catanesi, M. G., Cervera, A., Chappell, A., Checchia, C., Cherdack, D., Chikuma, N., Christodoulou, G., Cicerchia, M., Coleman, J., Collazuol, G., Cook, L., Coplowe, D., Cudd, A., Dabrowska, A., De Rosa, G., Dealtry, T., Denner, P. F., Dennis, S. R., Densham, C., Di Lodovico, F., Dokania, N., Dolan, S., Doyle, T. A., Drapier, O., Dumarchez, J., Dunne, P., Eguchi, A., Eklund, L., Emery-Schrenk, S., Ereditato, A., Fernandez, P., Feusels, T., Finch, A. J., Fiorentini, G. A., Fiorillo, G., Francois, C., Friend, M., Fujii, Y., Fujita, R., Fukuda, D., Fukuda, R., Fukuda, Y., Fusshoeller, K., Giganti, C., Golan, T., Gonin, M., Gorin, A., Guigue, M., Hadley, D. R., Haigh, J. T., Hamacher-Baumann, P., Hartz, M., Hasegawa, T., Hassani, S., Hastings, N. C., Hayashino, T., Hayato, Y., Hiramoto, A., Hogan, M., Holeczek, J., Van, N. T. Hong, Honjo, T., Iacob, F., Ichikawa, A. K., Ikeda, M., Ishida, T., Ishii, T., Ishitsuka, M., Iwamoto, K., Izmaylov, A., Izumi, N., Jakkapu, M., Jamieson, B., Jenkins, S. J., Jesús-Valls, C., Jiang, M., Johnson, S., Jonsson, P., Jung, C. K., Jurj, P. B., Kabirnezhad, M., Kaboth, A. C., Kajita, T., Kakuno, H., Kameda, J., Karlen, D., Kasetti, S. P., Kataoka, Y., Katayama, Y., Katori, T., Kato, Y., Kearns, E., Khabibullin, M., Khotjantsev, A., Kikawa, T., Kikutani, H., Kim, H., King, S., Kisiel, J., Knight, A., Knox, A., Kobata, T., Kobayashi, T., Koch, L., Koga, T., Konaka, A., Kormos, L. L., Koshio, Y., Kostin, A., Kowalik, K., Kubo, H., Kudenko, Y., Kukita, N., Kuribayashi, S., Kurjata, R., Kutter, T., Kuze, M., Labarga, L., Lagoda, J., Lamoureux, M., Last, D., Laveder, M., Lawe, M., Licciardi, M., Lindner, T., Litchfield, R. P., Liu, S. L., Li, X., Longhin, A., Ludovici, L., Lu, X., Lux, T., Machado, L. N., Magaletti, L., Mahn, K., Malek, M., Manly, S., Maret, L., Marino, A. D., Marti-Magro, L., Martin, J. F., Maruyama, T., Matsubara, T., Matsushita, K., Matveev, V., Mauger, C., Mavrokoridis, K., Mazzucato, E., McCarthy, M., McCauley, N., McElwee, J., McFarland, K. S., McGrew, C., Mefodiev, A., Metelko, C., Mezzetto, M., Minamino, A., Mineev, O., Mine, S., Miura, M., Bueno, L. Molina, Moriyama, S., Morrison, J., Mueller, Th. A., Munteanu, L., Murphy, S., Nagai, Y., Nakadaira, T., Nakahata, M., Nakajima, Y., Nakamura, A., Nakamura, K. G., Nakamura, K., Nakano, Y., Nakayama, S., Nakaya, T., Nakayoshi, K., Nantais, C., Naseby, C. E. R., Ngoc, T. V., Niewczas, K., Nishikawa, K., Nishimura, Y., Noah, E., Nonnenmacher, T. S., Nova, F., Novella, P., Nowak, J., Nugent, J. C., O'Keeffe, H. M., O'Sullivan, L., Odagawa, T., Ogawa, T., Okada, R., Okumura, K., Okusawa, T., Oser, S. M., Owen, R. A., Oyama, Y., Palladino, V., Palomino, J. L., Paolone, V., Pari, M., Parker, W. C., Parsa, S., Pasternak, J., Paudyal, P., Pavin, M., Payne, D., Penn, G. C., Pickering, L., Pidcott, C., Pintaudi, G., Guerra, E. S. Pinzon, Pistillo, C., Popov, B., Porwit, K., Posiadala-Zezula, M., Pritchard, A., Quilain, B., Radermacher, T., Radicioni, E., Radics, B., Ratoff, P. N., Reinherz-Aronis, E., Riccio, C., Rondio, E., Roth, S., Rubbia, A., Ruggeri, A. C., Ruggles, C., Rychter, A., Sakashita, K., Sánchez, F., Santucci, G., Schloesser, C. M., Scholberg, K., Schwehr, J., Scott, M., Seiya, Y., Sekiguchi, T., Sekiya, H., Sgalaberna, D., Shah, R., Shaikhiev, A., Shaker, F., Shaykina, A., Shiozawa, M., Shorrock, W., Shvartsman, A., Skwarczynski, K., Smirnov, A., Smy, M., Sobczyk, J. T., Sobel, H., Soler, F. J. P., Sonoda, Y., Steinmann, J., Suvorov, S., Suzuki, A., Suzuki, S. Y., Suzuki, Y., Sztuc, A. A., Tada, M., Tajima, M., Takeda, A., Takeuchi, Y., Tanaka, H. K., Tanaka, H. A., Tanaka, S., Tanihara, Y., Tani, M., Teshima, N., Thompson, L. F., Toki, W., Touramanis, C., Towstego, T., Tsui, K. M., Tsukamoto, T., Tzanov, M., Uchida, Y., Vagins, M., Valder, S., Vallari, Z., Vargas, D., Vasseur, G., Vilela, C., Vinning, W. G. S., Vladisavljevic, T., Volkov, V. V., Wachala, T., Walker, J., Walsh, J. G., Wang, Y., Wark, D., Wascko, M. O., Weber, A., Wendell, R., Wilking, M. J., Wilkinson, C., Wilson, J. R., Wilson, R. J., Wood, K., Wret, C., Xia, J., Yamada, Y., Yamamoto, K., Yanagisawa, C., Yang, G., Yano, T., Yasutome, K., Yen, S., Yershov, N., Yokoyama, M., Yoshida, T., Yu, M., Zalewska, A., Zalipska, J., Zaremba, K., Zarnecki, G., Ziembicki, M., Zimmerman, E. D., Zito, M., Zsoldos, S., Zykova, A.

论文摘要

T2K中微子束的电子(抗)中微子成分构成了远探测器在电子(抗)中微子外观测量中最大的背景。电子中微子散射直接用T2K离轴接近检测器ND280测量。本文讨论了从中微子和抗中微子模式梁中选择电子(抗)中微子事件中中微子事件。通量集成的单个差分电荷电流包含电子(抗)中微子横截面,$dσ/dp $和$dσ/dσ/d \ cos(θ)$,以及在动量和散射角度的有限相位空间中的总横截面($ p> 300 $ meV/c/c> 300 $ mev/c和$θ\ leq 45^circip and a bin fit and circip and circipt and cincip circipt and circipt and circipt^circipt and circipt^circipt and circipt^circipt;对中微子蒙特卡洛发生器的预测,导致了良好的一致性。

The electron (anti-)neutrino component of the T2K neutrino beam constitutes the largest background in the measurement of electron (anti-)neutrino appearance at the far detector. The electron neutrino scattering is measured directly with the T2K off-axis near detector, ND280. The selection of the electron (anti-)neutrino events in the plastic scintillator target from both neutrino and anti-neutrino mode beams is discussed in this paper. The flux integrated single differential charged-current inclusive electron (anti-)neutrino cross-sections, $dσ/dp$ and $dσ/d\cos(θ)$, and the total cross-sections in a limited phase-space in momentum and scattering angle ($p > 300$ MeV/c and $θ\leq 45^{\circ}$) are measured using a binned maximum likelihood fit and compared to the neutrino Monte Carlo generator predictions, resulting in good agreement.

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