论文标题

杂质绑定状态作为拓扑结构的检测器,重新审视

Impurity bound states as detectors of topological band structures revisited

论文作者

Diop, Seydou-Samba, Fritz, Lars, Vojta, Matthias, Rachel, Stephan

论文摘要

拓扑绝缘子的带结构以非本地拓扑不变性为特征。因此,很少有使用局部探针进行实验检测的建议。最近的论文[Slager等,物理学。基于特定类别模型的理论结果,B 92,085126(2015)]认为,在两个空间维度中具有拓扑琐碎和非平凡的带状结构的绝缘体显示出对点样杂质的质量不同的响应。在这里,我们对蜂窝晶格上的一系列非相互作用电子模型的杂质响应进行了全面研究,该模型通过破裂的反转,破损的时间逆转,损坏的$ C_3 $或断裂的翻译对称性来驱动的绝缘。这些病例包括霍夫史塔特带,应变诱导的伪landau水平和高阶拓扑绝缘子。我们的结果证实,对于尊重晶格对称性的跳跃模型,对单个杂质的响应确实可以区分琐碎的和非平凡的带拓扑。但是,对于调制或不均匀的主机系统,我们发现物质的琐碎状态可以显示出类似于拓扑非平凡状态的杂质响应,因此诊断失败。

Band structures of topological insulators are characterized by non-local topological invariants. Consequently, proposals for the experimental detection using local probes are rare. A recent paper [Slager et al., Phys. Rev. B 92, 085126 (2015)] has argued, based on theoretical results for a particular class of models, that insulators with topologically trivial and non-trivial band structures in two space dimensions display a qualitatively different response to point-like impurities. Here we present a comprehensive investigation of the impurity response of a large set of models of non-interacting electrons on the honeycomb lattice, driven insulating by either broken inversion, broken time reversal, broken $C_3$, or broken translation symmetry. These cases include Hofstadter bands, strain-induced pseudo-Landau levels and higher-order topological insulators. Our results confirm that for hopping models respecting the lattice symmetries, the response to a single impurity can indeed distinguish between trivial and non-trivial band topology. However, for modulated or inhomogeneous host systems we find that trivial states of matter can display an impurity response akin to that of topologically non-trivial states, and thus the diagnostic fails.

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