论文标题
纳米颗粒特性与X射线分析技术的相互作用
Interaction of nanoparticle properties and X-ray analytical techniques
论文作者
论文摘要
在这项工作中,PT-TI核壳纳米颗粒(NP)的尺寸为2 nm至3 nm和30000 U \ pm 1500 U作为指定的单个颗粒质量,通过质量选择的集群束源沉积在平坦的硅底物上,用于研究X射线站立波(XSW)的Field Wiff coptage coptage coptigation np Surpsive np coptage nps coptage np coptage(xsw)。研究的重点是确定XSW强度不受干扰的平面表面进近的有效性范围,以依赖于表面的实际覆盖率。因此,使用无放射法校准的仪器使用无参考的放牧发病率X射线荧光分析(GIXRF)对纳米颗粒进行表征。此外,进行了近边缘的X射线吸收细胞(NexAFS)测量,以研究核壳纳米颗粒中钛的结合状态,该结合状态被认为是无定形TIO2。 GIXRF测量和计算出的XSW场强度的组合允许量化核心壳纳米粒子表面覆盖率。对于六个不同的样品,可以确定峰值表面覆盖率从完整单层等效覆盖率的7%到130%不等。当前研究的结果是,核壳纳米颗粒会随着表面覆盖的增加而修改XSW场的强度分布。该实验结果与使用有效密度方法在不同表面覆盖的XSW场强度分布一致。
In this work, Pt-Ti core-shell nanoparticles (NP) of 2 nm to 3 nm in size and 30000 u \pm 1500 u as specified single particle mass, deposited on flat silicon substrates by means of a mass-selected cluster beam source, were used for the investigation of the modification of the X-Ray Standing Wave (XSW) field intensity with increasing NP surface coverage. The focus of the investigation is on the determination of the range of validity of the undisturbed flat surface approach of the XSW intensity in dependence of the actual coverage rate of the surface. Therefore, the nanoparticles were characterized using reference-free grazing incidence X-ray fluorescence analysis (GIXRF) employing radiometrically calibrated instrumentation. In addition, near-edge X-ray absorption fine structure (NEXAFS) measurements were performed to investigate the binding state of titanium in the core-shell nanoparticles which was found to be amorphous TiO2. The combination of GIXRF measurements and of the calculated XSW field intensities allow for a quantification of the core-shell nanoparticle surface coverage. For six different samples, the peak surface coverage could be determined to vary from 7 % to 130 % of a complete monolayer-equivalent coverage. A result of the current investigation is that core-shell nanoparticles modify the intensity distribution of the XSW field with increasing surface coverage. This experimental result is in line with calculated XSW field intensity distributions at different surface coverages using an effective density approach.