论文标题
HL-LHC的CMS MUON检测器电阻板腔的老化研究
Aging Study on Resistive Plate Chambers of the CMS Muon Detector for HL-LHC
论文作者
论文摘要
在高光度大型强子对撞机（HL-LHC）程序中，在接下来的几年中，瞬时发光度将增加到5 $ \ times $ 10 $^{34} $ cm $^{ - 2} $ s $ s $^{ - 1} $，这意味着比名义LHC高的五个因子。在此期间，当前的CMS电阻板室（RPC）系统将受到高于设计器设计的探测器的背景速率，这可能会影响探测器的性质并引起衰老效应。为了研究当前的RPC系统是否可以在HL-LHC运行期间维持艰难的背景条件，在Cern Gamma辐射设施中正在进行专门的寿命测试，在此期间，一些备用RPC暴露于高γ辐射中以长期模仿HL-LHC操作条件。在寿命测试期间，主要检测器参数是作为集成电荷的函数连续监测的。该研究的初步结果将在收集足够数量的HL-LHC的预期综合电荷后。
In the High Luminosity Large Hadron Collider (HL-LHC) program, during the next years, the instantaneous luminosity will increase up to 5 $\times$ 10$^{34}$ cm$^{-2}$ s$^{-1}$ which means a factor five higher than the nominal LHC. In that period, the present CMS Resistive Plate Chambers (RPC) system will be subjected to background rates higher than those for which the detectors have been designed, which could affect the detector properties and induce aging effects. To study whether the present RPC system can sustain the hard background conditions during the HL-LHC running period, a dedicated longevity test is ongoing at the CERN Gamma Irradiation Facility, where a few spare RPCs are exposed to high gamma radiation for a long term period to mimic the HL-LHC operational conditions. During the longevity test, the main detector parameters are continuously monitored as a function of the integrated charge. Preliminary results of the study, after having collected a sufficient amount of the expected integrated charge at HL-LHC, will be presented.
