论文标题

在光伏模块中选择用于光学污垢建模和检测的最佳波长

Selection of optimal wavelengths for optical soiling modelling and detection in photovoltaic modules

论文作者

Micheli, Leonardo, Fernandez, Eduardo F., Muller, Matthew, Smestad, Greg P., Almonacid, Florencia

论文摘要

通过减少到达光伏电池的光量并改变其外部光谱响应,污垢会影响光伏(PV)模块的性能。目前,污染监测市场正在朝着测量传输或反射率的光学传感器迈进,而不是直接测量污垢对光伏模块性能的影响。这些使用单个光学测量的传感器无法纠正取决于太阳辐照光谱和受监测的PV材料的光谱响应的污垢损失。这项工作研究了仅使用两种或三个单色测量值提取完整的污染谱谱,可以通过提取完整的污垢谱图来改善污染的光学检测方法。在这项工作中分析了用分光光度计测量的光谱传输数据,该数据在西班牙Jaén进行了为期46周的实验污垢研究中收集。发现光谱曲线用于弄脏的PV玻璃半球形透射率,可显着改善污垢检测,独立于PV材料和辐照度条件,返回最低误差。此外,这项工作表明,还可以选择测量波长,以最大程度地减少污染损失检测误差,具体取决于受监视的PV半导体材料(硅,CDTE,A-SI,CIGS和代表性钙钛矿)。与单波长测量技术相比,这项工作中讨论的方法对潜在测量误差更为强大。

Soiling impacts the photovoltaic (PV) module performance by reducing the amount of light reaching the photovoltaic cells and by changing their external spectral response. Currently, the soiling monitoring market is moving toward optical sensors that measure transmittance or reflectance, rather than directly measuring the impact of soiling on the performance of photovoltaic modules. These sensors, which use a single optical measurement, are not able to correct the soiling losses that depend on the solar irradiance spectra and on the spectral response of the monitored PV material. This work investigates methods that can improve the optical detection of soiling by extracting the full soiling spectrum profiles using only two or three monochromatic measurements. Spectral transmittance data, measured with a spectrophotometer and collected during a 46-week experimental soiling study carried out in Jaén, Spain, was analysed in this work. The use of a spectral profile for the hemispherical transmittance of soiled PV glass is found to significantly improve the soiling detection, returning the lowest errors independently of the PV materials and irradiance conditions. In addition, this work shows that it is also possible to select the measurement wavelengths to minimize the soiling loss detection error depending on the monitored PV semiconductor material (silicon, CdTe, a-Si, CIGS and a representative perovskite). The approaches discussed in this work are also found to be more robust to potential measurement errors compared to single wavelength measurement techniques.

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