论文标题
短脉冲红外辐射的激发和电离的椭圆度依赖性
Ellipticity Dependence of Excitation and Ionization of Argon Atoms by Short-Pulse Infrared Radiation
论文作者
论文摘要
当原子或分子暴露于强短脉冲红外辐射时，可能会发生电离以及“沮丧的隧道电离”（FTI）（FTI），其中几乎几乎电离电子的一部分将重新组合到初始地面或激发的结合状态。我们分析了在单活动电子近似（SAE）中预测的相对信号的椭圆度依赖性，其有效性与无参数的多电子\ hbox {$ r $ -mmatrix}（近距离耦合）与时间依赖方法进行了检查。我们发现两个模型的结果之间有很好的一致性，从而对SAE模型提供了信心来治疗感兴趣的过程。在数值计算中发现的相对激发概率与Landsman {\ It等人的预测（新的物理学杂志{\ bf 15}（2013）013001）和zhao {\ it等人（eT al。} \（Optics Express Express {\ bf 27} 216（2019）216（2019年）的比较（2019年）216（2019）216（fust）对于较长的脉冲，椭圆度的依赖性比从陆地人{\ it等}公式获得的较大，但是与Zhao {\ it等人预测的线性极化辐射相比，我们没有获得增加的增加。
When atoms or molecules are exposed to strong short-pulse infrared radiation, ionization as well as "frustrated tunneling ionization" (FTI) can occur, in which a portion of the almost ionized electrons recombine into the initial ground or an excited bound state. We analyze the ellipticity dependence of the relative signals that are predicted in a single-active electron approximation (SAE), the validity of which is checked against a parameter-free multi-electron \hbox{$R$-matrix} (close-coupling) with time dependence approach. We find good agreement between the results from both models, thereby providing confidence in the SAE model potential to treat the process of interest. Comparison of the relative excitation probabilities found in our numerical calculations with the predictions of Landsman {\it et al.}\ (New Journal of Physics {\bf 15} (2013) 013001) and Zhao {\it et al.}\ (Optics Express {\bf 27} (2019) 21689) reveals good agreement with the former for short pulses. For longer pulses, the ellipticity dependence becomes wider than that obtained from the Landsman {\it et al.} formula, but we do not obtain the increase compared to linearly polarized radiation predicted by Zhao {\it et al.}
