论文标题
低成本频谱分析仪，用于扫描探针显微镜中的故障射击噪声源
An low-cost spectrum analyzer for trouble shooting noise sources in scanning probe microscopy
论文作者
论文摘要
扫描探针显微镜对许多类型的外部和内部干扰敏感，包括电气，机械和声音噪声。有时，噪声甚至会被误解为图像中的真实特征。因此，对任何噪声的频率和幅度进行量化是发现源并将其从系统中消除的关键。尽管商业频谱分析仪非常适合此任务，但它们却相当昂贵，而且并非总是可用的。我们提供了一种简单，具有成本效益的解决方案，其形式是从仪器中输出到智能手机频谱分析仪应用程序的形式。具体而言，扫描探针信号，例如扫描隧道显微镜的隧道电流被馈送到光谱分析仪，该谱系将时域的声信号转换为频域。当扫描探针与样品接触而不是扫描时，输出是一个频谱，其中包含影响显微镜本身的任何周期性噪声的幅度和频率，从而使故障排除开始。
Scanning probe microscopes are notoriously sensitive to many types of external and internal interference including electrical, mechanical and acoustic noise. Sometimes noise can even be misinterpreted as real features in the images. Therefore, quantification of the frequency and magnitude of any noise is key to discovering the source and eliminating it from the system. While commercial spectrum analyzers are perfect for this task, they are rather expensive and not always available. We present a simple, cost effective solution in the form of an audio output from the instrument coupled to a smart phone spectrum analyzer application. Specifically, the scanning probe signal, e.g. the tunneling current of a scanning tunneling microscope is fed to the spectrum analyzer which Fourier transforms the time domain acoustic signal into the frequency domain. When the scanning probe is in contact with the sample, but not scanning, the output is a spectrum containing both the amplitude and frequency of any periodic noise affecting the microscope itself, enabling troubleshooting to begin.
