论文标题

ATPG引导的故障注射对逻辑锁定的攻击

ATPG-Guided Fault Injection Attacks on Logic Locking

论文作者

Jain, Ayush, Rahman, Tanjidur, Guin, Ujjwal

论文摘要

逻辑锁定是一种良好接受的保护技术,可以信任集成电路(ICS)的外包设计和制造过程,其中通过在Netlist中加入其他关键门来修改原始设计,从而导致了一个依赖密钥的功能电路。芯片的原始功能一旦用秘密键编程,否则就会为某些输入模式产生错误的结果。在过去的十年中,已经提出了不同的攻击来打破逻辑锁定,同时激励研究人员开发更安全的对策。在本文中,我们提出了一种新颖的基于故障的差异故障分析(DFA)攻击,该攻击可用于打破依赖于存储的秘密键的逻辑锁定。这项提出的攻击是基于自我引用的,其中秘密键是通过在钥匙线中注入故障并将响应与无故障对应物进行比较来确定的。商业ATPG工具可用于生成检测这些故障的测试模式,该模式将在DFA中用于确定秘密键。一种测试模式足以确定一个关键位,最多会导致| k |测试模式以确定大小| k |的整个秘密密钥。提出的攻击是通用的,可以扩展以打破任何逻辑锁定电路。

Logic Locking is a well-accepted protection technique to enable trust in the outsourced design and fabrication processes of integrated circuits (ICs) where the original design is modified by incorporating additional key gates in the netlist, resulting in a key-dependent functional circuit. The original functionality of the chip is recovered once it is programmed with the secret key, otherwise, it produces incorrect results for some input patterns. Over the past decade, different attacks have been proposed to break logic locking, simultaneously motivating researchers to develop more secure countermeasures. In this paper, we propose a novel stuck-at fault-based differential fault analysis (DFA) attack, which can be used to break logic locking that relies on a stored secret key. This proposed attack is based on self-referencing, where the secret key is determined by injecting faults in the key lines and comparing the response with its fault-free counterpart. A commercial ATPG tool can be used to generate test patterns that detect these faults, which will be used in DFA to determine the secret key. One test pattern is sufficient to determine one key bit, which results in at most |K| test patterns to determine the entire secret key of size |K|. The proposed attack is generic and can be extended to break any logic locked circuits.

扫码加入交流群

加入微信交流群

微信交流群二维码

扫码加入学术交流群,获取更多资源