论文标题

通过分子束外延生长的自辅助GAAS纳米线的Wurtzite相控制

Wurtzite phase control for self-assisted GaAs nanowires grown by molecular beam epitaxy

论文作者

Dursap, T., Vettori, M., Botella, C., Regreny, P., Blanchard, N., Gendry, M., Chauvin, N., Bugnet, M., Danescu, A., Penuelas, J.

论文摘要

III-V半导体纳米线(NWS)中晶相的准确控制是设备应用的重要里程碑。在这项工作中,我们提出了一种在自辅助NWS中选择和维持Wurtzite(WZ)晶相的方法。通过选择一个特定的状态,其中NW增长过程是一个自调节系统,选择锌 - 蓝色(ZB)或WZ相的主要实验参数是V/III通量比。可以通过更改AS通量来监测后者,并在GA液滴的润湿角以目标间隔掉落时,将系统驱动到固定状态,通常在90°-125°范围内,以实现WZ相的生长。对原位Rheed进化的分析,高分辨率扫描传输电子显微镜(HRSTEM),暗场传输电子显微镜(DF-TEM)和光致发光(PL)数据均证实了较长的少数微米长的纯纯WZ段,该pure fl of v/iiii flux falux fallux fallux fall vails nws nws获得了MBE增长。

The accurate control of the crystal phase in III-V semiconductor nanowires (NWs) is an important milestone for device applications. In this work, we present a method to select and maintain the wurtzite (WZ) crystal phase in self-assisted NWs. By choosing a specific regime where the NW growth process is a self-regulated system, the main experimental parameter to select the zinc-blende (ZB) or WZ phase is the V/III flux ratio. The latter can be monitored by changing the As flux, and drives the system toward a stationary regime when the wetting angle of the Ga droplet falls in a target interval, typically in the 90° - 125° range for the WZ phase growth. The analysis of the in situ RHEED evolution, high-resolution scanning transmission electron microscopy (HRSTEM), dark field transmission electron microscopy (DF-TEM), and photoluminescence (PL) data all confirm the control of an extended few micrometers long pure WZ segment obtained by MBE growth of self-assisted GaAs NWs with a V/III flux ratio of 4.0.

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