论文标题
粉末衍射仪的X射线源和硅微带探测器的辐射测试的校准
Calibration of X-Ray Source of a Powder Diffractometer and Radiation Test of Silicon Microstrip Detectors
论文作者
论文摘要
提出了一种基于快速闪烁器计数器的粉末衍射仪X射线源的焦点焦点上绝对通量校准的柔性设备。测得的通量取决于X射线管上的高电压，范围为200-400 MHz，而估计5％的通量不确定性。我们还将这种校准应用于多通道硅微带X射线检测器的辐射硬度研究。
A flexible apparatus for calibration of the absolute flux at the focal plane of the X-ray Source of a Powder Diffractometer, based on a fast scintillator counter, is presented. The measured fluxes, depending on the high voltage on the X-ray tube, were at the range 200 - 400 MHz, while an uncertainty in the flux of the order of 5% has been estimated. We also applied this calibration for radiation hardness study of a multichannel silicon microstrip X-Ray detector.
