论文标题
量子门中小错误的扰动层析成像
Perturbative tomography of small errors in quantum gates
论文作者
论文摘要
我们提出了一个有效的协议，以完全重建一组高保真量子门。通常，重建高保真量子门的效率受到采样噪声的限制。我们的协议基于扰动方法，并具有两个阶段。在第一阶段，噪声量子门的初始部分是通过测量地图痕迹重建的，并且可以通过以类似于随机基准测试和量子频谱断层扫描的方式扩增噪声来测量迹线。在第二阶段，通过使用Unital部分扩增非致产部分，我们可以有效地重建非致产部分。我们表明，协议量表与门的错误率对数中所需的测量数量。
We propose an efficient protocol to fully reconstruct a set of high-fidelity quantum gates. Usually, the efficiency of reconstructing high-fidelity quantum gates is limited by the sampling noise. Our protocol is based on a perturbative approach and has two stages. In the first stage, the initial part of noisy quantum gates is reconstructed by measuring traces of maps, and the trace can be measured by amplifying the noise in a way similar to randomised benchmarking and quantum spectral tomography. In the second stage, by amplifying the non-unital part using the unital part, we can efficiently reconstruct the non-unital part. We show that the number of measurements needed in our protocol scales logarithmically with the error rate of gates.
