论文标题
基于处理器的嵌入式系统中的安全故障的新类别
New categories of Safe Faults in a processor-based Embedded System
论文作者
论文摘要
在分析其可靠性及其测试计划开发时，在电子系统中识别安全故障（即保证不会造成任何故障的故障）是至关重要的一步。不幸的是，可用的EDA工具对安全故障识别的支持很大，因此仍然是一个开放的问题。安全至关重要应用中使用的现代系统的复杂性增长使其识别进一步复杂化。在本文中，我们根据管道处理器确定了嵌入式系统中的一些安全故障。还提出了一种自动化安全故障识别的新方法。属于每个类别的安全故障被确定为自动测试模式生成（ATPG）技术。所提出的方法应用于围绕OpenRISC1200开源处理器构建的样本系统。
The identification of safe faults (i.e., faults which are guaranteed not to produce any failure) in an electronic system is a crucial step when analyzing its dependability and its test plan development. Unfortunately, safe fault identification is poorly supported by available EDA tools, and thus remains an open problem. The complexity growth of modern systems used in safety-critical applications further complicates their identification. In this article, we identify some classes of safe faults within an embedded system based on a pipelined processor. A new method for automating the safe fault identification is also proposed. The safe faults belonging to each class are identified resorting to Automatic Test Pattern Generation (ATPG) techniques. The proposed methodology is applied to a sample system built around the OpenRisc1200 open source processor.
