论文标题
单轴磁各向异性轴和多晶铁磁性膜中主电阻率的相关性
Correlation of uniaxial magnetic anisotropy axes and principal resistivities in polycrystalline ferromagnetic films
论文作者
论文摘要
在本研究中，我们证明了沿铁磁性薄膜（PY）多晶膜的磁轴的电阻率张量（$ρ$）的测量。为此，使用了传统的霍尔吧和最近的扩展范德布鲁（Van der Pauw）方法来确定胶片平面中的2 $ρ$。通过在原位磁场内的正常入射溅射沉积来制备样品，以诱导膜中的平面单轴磁各向异性。由于$ρ$可能会受到膜的内部磁化的影响，因此我们通过在膜平面中旋转饱和磁场进行测量。两种方法都表明，与硬轴相比，沿膜的易于轴的平均电阻率较低。由于X射线衍射结果表明膜中没有统治纹理，因此我们得出结论，单轴磁轴和主电阻率轴之间存在相关性。这是一个重要的发现，它允许在没有磁力测定法的情况下确定磁各向异性轴的方向。结果还验证了原子或命令是PY中单轴磁各向异性的起源，因为电阻率对固体的顺序水平敏感。这里使用的扩展范德布鲁（Van der Pauw）可以轻松地在具有实际感兴趣的样本上执行。
In the present study, we demonstrate the measurement of resistivity tensor ($ρ$) along the magnetic axes of a polycrystalline film of ferromagnetic permalloy (Py). To this end, conventional Hall-bar and a more recent extended van der Pauw methods were utilized for determining 2D $ρ$ in the film plane. The samples were prepared by normal incidence sputter deposition within an in-situ magnetic field to induce in-plane uniaxial magnetic anisotropy in the film. Since $ρ$ might be affected by the internal magnetization of the film, we performed measurements by rotation of a saturating magnetic field in the film plane. Both methods indicate that the average resistivity is lower along the easy axis of the film compared to the hard axis. Since X-ray diffraction results indicated no dominating texture in the film, we concluded that there is a correlation between uniaxial magnetic axes and principal resistivity axes. This is an important finding that allows determining the direction of magnetic anisotropy axes without magnetometry. The results also verify atomic or pair ordering to be the origin of uniaxial magnetic anisotropy in the Py since resistivity is sensitive to the level of order in solids. The extended van der Pauw utilized here can be easily performed on the as-received samples which is of practical interest.
