论文标题
半导体系统中的顺磁杂质的电子偏斜的指纹
Fingerprints of the electron skew-scattering on paramagnetic impurities in semiconductor systems
论文作者
论文摘要
在本文中,我们认为对非磁性系统中的顺磁杂质的电子偏斜(例如散装半导体)具有出色的指纹,允许将其直接与新兴霍尔响应的其他微观机制区分开。从理论上讲,我们证明了杂质磁矩和移动电子之间的交换相互作用导致电流电流的出现,即使在零电子自旋极化下也持续存在。我们描述了这种效果背后的两种微观机制,即交换相互作用有助于偏斜散射,以及由于旋转电导率和旋转电导率之间的差异,SHE诱导横向自旋电流到电荷的转换。我们提出了一种基于自旋注入铁磁 - 轴导剂装置的本质上全电动方案,该方案允许人们通过检测霍尔电压中的自旋极化术语来揭示顺磁杂质对霍尔现象的影响。
In this paper we argue that the electron skew-scattering on paramagnetic impurities in non-magnetic systems, such as bulk semiconductors, possesses a remarkable fingerprint allowing to differentiate it directly from other microscopic mechanisms of the emergent Hall response. We demonstrate theoretically that the exchange interaction between the impurity magnetic moment and mobile electrons leads to the emergence of an electric Hall current persisting even at zero electron spin polarization. We describe two microscopic mechanisms behind this effect, namely the exchange interaction assisted skew-scattering and the conversion of the SHE induced transverse spin current to the charge one owing to the difference between the spin-up and spin-down conductivities. We propose an essentially all-electric scheme based on a spin-injection ferromagnetic-semiconductor device which allows one to reveal the effect of paramagnetic impurities on the Hall phenomena via the detection of the spin polarization independent terms in the Hall voltage.