论文标题
使用非标记测量结果从纯纠缠的两Qutrit状态的最大随机性无关的认证
Device-independent certification of maximal randomness from pure entangled two-qutrit states using non-projective measurements
论文作者
论文摘要
尽管最近已经证明了如何以与设备无关的方式证明从任何纯正的两倍纠缠状态的最大随机性[E. Woodhead等人，物理。 Rev. Research 2，042028（R）（2020）]，来自较高局部维度的纠缠状态的最佳随机性认证问题保持开放。在这里，我们介绍了一种与设备无关的认证方法，该方法是使用纯二分之一的两分式态和最大的九次验证态和极端的九种结果一般非注射式测量值的最大数量$ 2 \ log_23 $随机位。为此，我们利用了最近在[S. Sarkar等人，Arxiv：2110.15176]，它结合了一种独立于设备的方法，用于在三维的Hilbert Spaces中与全Weyl-Heisenberg基础认证，并将单方面依赖的方法与单方面的单方面依赖性方法进行认证，以证明两Qutrit部分纠缠状态。
While it has recently been demonstrated how to certify the maximal amount of randomness from any pure two-qubit entangled state in a device-independent way [E. Woodhead et al., Phys. Rev. Research 2, 042028(R)(2020)], the problem of optimal randomness certification from entangled states of higher local dimension remains open. Here we introduce a method for device-independent certification of the maximal possible amount of $2\log_23$ random bits using pure bipartite entangled two-qutrit states and extremal nine-outcome general non-projective measurements. To this aim, we exploit the extended Bell scenario introduced recently in [S. Sarkar et al., arXiv:2110.15176], which combines a device-independent method for certification of the full Weyl-Heisenberg basis in three-dimensional Hilbert spaces together with a one-sided device-independent method for certification of two-qutrit partially entangled states.
