论文标题

开尔文探针显微镜在CVD生长的双层石墨烯中扭曲角度依赖的工作功能

Twisted Angle-Dependent Work Functions in CVD-Grown Twisted Bilayer Graphene by Kelvin Probe Force Microscopy

论文作者

Gu, Shangzhi, Liu, Wenyu, Xian, Guoyu, Mi, Shuo, Guo, Jiangfeng, Li, Songyang, Lei, Le, Dong, Haoyu, Xu, Rui, Pang, Fei, Chen, Shanshan, Yang, Haitao, Cheng, Zhihai

论文摘要

调整双层石墨烯(BLG)的层间扭曲角对其电子特性有重大影响,包括超导性,拓扑跃迁,铁磁状态和相关的绝缘状态。这些外来的电子特性敏感地取决于双层石墨烯样品的工作功能。在这里,开尔文探针力显微镜(KPFM)详细研究了CVD生长的扭曲双层石墨烯(TBLG)的扭曲角依赖性工作功能,并结合了拉曼光谱。测量了Bernal堆叠多层石墨烯的厚度依赖性表面电位。 AB-BLG和TBLG由于KPFM的扭曲角特异性表面电位而直接确定。通过对KPFM和拉曼光谱测量值的原位组合研究,扭曲角度和表面电势的详细关系进一步获得。通过受控退火过程进一步探索了TBLG的热稳定性。我们的工作提供了TBLG的扭曲角度依赖性表面电位,并为进一步探索其扭曲角依赖性的新型电子特性奠定了基础。

Tailoring the interlayer twist angle of bilayer graphene (BLG) has a significant influence on its electronic properties, including superconductivity, topological transitions, ferromagnetic states and correlated insulating states. These exotic electronic properties are sensitively dependent on the work functions of bilayer graphene samples. Here, the twisted angle-dependent work functions of CVD-grown twisted bilayer graphene (tBLG) are detailed investigated by Kelvin Probe Force Microscopy (KPFM) in combination with Raman spectra. The thickness-dependent surface potentials of Bernal-stacked multilayer graphene were measured. The AB-BLG and tBLG are directly determined by KPFM due to their twist angle-specific surface potentials. The detailed relationship of twist angles and surface potentials are further obtained by the in-situ combination investigation of KPFM and Raman spectra measurements. The thermal stability of tBLG was further explored through controlled annealing process. Our work provides the twisted angle-dependent surface potentials of tBLG and lays the foundation for further exploring their twist-angle-dependent novel electronic properties.

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