论文标题
部分可观测时空混沌系统的无模型预测
Spectroscopic assessment of short-term nitric acid doping of epitaxial graphene
论文作者
论文摘要
这项工作报告了将硝酸用作吸附剂时外延石墨烯设备中孔掺杂的瞬时信息的信息。在真空条件下，通过电和光谱手段监测解吸过程，以从相应的数据中提取相关的时间尺度。了解孔掺杂的可逆性至关重要，因为这种设备处理可以是大规模金属门控的合适替代品。大多数测量是在室温下暴露后进行的，对于某些电气传输测量，将1.5 K的真空条件应用于许多测量，以复制实验室条件，在该实验室条件下，将测量使用这种掺杂方法的设备。将传输测量的相关时间尺度与X射线光电谱光谱和傅立叶变换红外光谱测量结果进行了比较，后者在环境条件下进行，并伴随着RESTSTRAHLEN带中的光谱计算。
This work reports information on the transience of hole doping in epitaxial graphene devices when nitric acid is used as an adsorbent. Under vacuum conditions, desorption processes are monitored by electrical and spectroscopic means to extract the relevant timescales from the corresponding data. It is of vital importance to understand the reversible nature of hole doping because such device processing can be a suitable alternative to large-scale, metallic gating. Most measurements are performed post-exposure at room temperature, and, for some electrical transport measurements, at 1.5 K. Vacuum conditions are applied to many measurements to replicate the laboratory conditions under which devices using this doping method would be measured. The relevant timescales from transport measurements are compared with results from X-ray photoelecton spectroscopy and Fourier transform infrared spectroscopy measurements, with the latter performed at ambient conditions and accompanied by calculations of the spectra in the Reststrahlen band.
