论文标题
辐照前后的新型Ti-Lgad结构的定时和空间分辨率的表征
Characterization of timing and spacial resolution of novel TI-LGAD structures before and after irradiation
论文作者
论文摘要
提出了新型沟槽分离的LGAD（TI-LGAD）技术的空间和时机分辨率的表征。这项技术是在FBK开发的，目的是实现4D像素，其中将精确的位置分辨率组合在单个设备中，并确定了最小电离颗粒（MIP）的精确定时。在Ti-Lgad技术中，像素化的LGAD垫被硅中蚀刻的物理沟渠分开。该技术可以减少插入式死亡区域，从而减轻填充因子问题。这项工作中研究的Ti-RD50生产是像素化的Ti-lgads中的第一个。使用带有红外激光器和$^{90} $ SR源设置的扫描TCT设置进行表征。
The characterization of spacial and timing resolution of the novel Trench Isolated LGAD (TI-LGAD) technology is presented. This technology has been developed at FBK with the goal of achieving 4D pixels, where an accurate position resolution is combined in a single device with the precise timing determination for Minimum Ionizing Particles (MIPs). In the TI-LGAD technology, the pixelated LGAD pads are separated by physical trenches etched in the silicon. This technology can reduce the interpixel dead area, mitigating the fill factor problem. The TI-RD50 production studied in this work is the first one of pixelated TI-LGADs. The characterization was performed using a scanning TCT setup with an infrared laser and a $^{90}$Sr source setup.
