论文标题
系统等效磁通密度I，Q，u，V的偏光干涉仪
System equivalent flux density of Stokes I, Q, U, V of a polarimetric interferometer
论文作者
论文摘要
我们介绍了所有四个Stokes参数的系统等效通量密度（SEFD）表达式：I，Q，U，V。表达式是根据我们的SEFD I（对于Stokes I）的推导而得出的，并将其工作的随后扩展到分阶段的阵列和多极干扰素计。 SEFD Q，U，V表达式推导的关键是要认识到Q，U，V的嘈杂估计值可以写入矩阵乘积的痕迹。这表明SEFD I是一种特殊情况，其中一般情况涉及对角线或抗DiAgonal 2x2矩阵，该基质插入了矩阵乘法中。在此步骤之后，i和q，u，v的SEFD之间的关系立即显现出来。我们介绍了基于得出的公式以及使用Murchison Widefield阵列（MWA）观察的仿真和观察之间的比较的交叉偶极子计算的示例计算。
We present the system equivalent flux density (SEFD) expressions for all four Stokes parameters: I, Q, U, V. The expressions were derived based on our derivation of SEFD I (for Stokes I) and subsequent extensions of that work to phased array and multipole interferometers. The key to the derivation of the SEFD Q, U, V expressions is to recognize that the noisy estimates of Q, U, V can be written as the trace of a matrix product. This shows that the SEFD I is a special case, where the general case involves a diagonal or anti-diagonal 2x2 matrix interposed in the matrix multiplication. Following this step, the relation between the SEFD for I and Q, U, V becomes immediately evident. We present example calculations for a crossed dipole based on the formulas derived and the comparison between simulation and observation using the Murchison Widefield Array (MWA).
