论文标题

被动组件的高密度垂直光学互连

High Density Vertical Optical Interconnects for Passive Assembly

论文作者

Weninger, Drew, Serna, Samuel, Jain, Achint, Kimerling, Lionel, Agarwal, Anuradha

论文摘要

光学和电子设备的共包装为实现50 TBPS顶部的架子开关包装提供了潜在的途径。在共包装的设计中,带宽,成本和能量的缩放受每个软件包的光学收发器(TXRX)的数量,而不是晶体管收缩。由于光学组件相对于其电子对应物的占地面积较大,因此在共包装的光学设计中垂直堆叠的光学TXRX芯片将成为必要。结果,有效,密度和广泛的一致性耐受性芯片到芯片光学耦合器的发展将是一种持续TXRX缩放的能力。在本文中,我们提出了一种新颖的方案,可以使用重叠的,逆的双龙头在玻璃波导上的220 nm氮化硅硅硅的绝缘体波导上垂直逐步融入标准的220 nm硅。 Simulation results using Lumerical's 3D Finite Difference Time Domain solver solver are presented, demonstrating insertion losses below -0.13 dB for an inter-chip spacing of 1 $μ$m, 1 dB vertical and lateral alignment tolerances of approximately $\pm$ 2.7 $μ$m, a greater than 300 nm 1 dB bandwidth, and 1 dB twist and tilt tolerance of approximately 2.3程度和0.4度。这些结果证明了我们的耦合器在需要高度性能,高密度,CMOS兼容的高密度,兼容平面光学连接中的潜力。

The co-packaging of optics and electronics provides a potential path forward to achieving beyond 50 Tbps top of rack switch packages. In a co-packaged design, the scaling of bandwidth, cost, and energy is governed by the number of optical transceivers (TxRx) per package as opposed to transistor shrink. Due to the large footprint of optical components relative to their electronic counterparts, the vertical stacking of optical TxRx chips in a co-packaged optics design will become a necessity. As a result, development of efficient, dense, and wide alignment tolerance chip-to-chip optical couplers will be an enabling technology for continued TxRx scaling. In this paper, we propose a novel scheme to vertically couple into standard 220 nm silicon on insulator waveguides from 220 nm silicon nitride on glass waveguides using overlapping, inverse double tapers. Simulation results using Lumerical's 3D Finite Difference Time Domain solver solver are presented, demonstrating insertion losses below -0.13 dB for an inter-chip spacing of 1 $μ$m, 1 dB vertical and lateral alignment tolerances of approximately $\pm$ 2.7 $μ$m, a greater than 300 nm 1 dB bandwidth, and 1 dB twist and tilt tolerance of approximately 2.3 degrees and 0.4 degrees, respectively. These results demonstrate the potential of our coupler for use in co-packaged designs requiring high performance, high density, CMOS compatible out of plane optical connections.

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