论文标题
在半导体重计脉冲响应中引起的电热耦合和散射电容引起的建模信号振荡
Modelling signal oscillations arising from electro-thermal coupling and stray capacitance in semiconducting bolometer impulse response
论文作者
论文摘要
已知半导体侧力的电热耦合在瞬态探测器响应中会产生非线性，尤其是当此类检测器偏向其理想区域以外（即超过IV曲线中的离职点）时。在存在偏置电路中的杂物电容（例如在长低温电缆中）的情况下，这种效果进一步更加复杂。我们介绍了这种电热耦合和杂散电容在复合NTD驻式钢铁中的影响的物理模型，其中先前在高$ v _ {\ rm bial} $的实验数据导致探测器对Alpha颗粒的激发反应的振荡。该模型重现了实验数据中看到的瞬时振荡，这取决于电热耦合和散射电容。这旨在作为此类振荡的实验和模拟示例，该振荡对于此侧验测定器的特定情况所证明。
Electro-thermal coupling in semiconductor bolometers is known to create nonlinearities in transient detector response, particularly when such detectors are biased outside of their ideal regions (i.e. past the turnover point in their IV curves). This effect is further compounded in the case where a stray capacitance in the bias circuit is present, for example in long cryogenic cabling. We present a physical model of the influence of such electro-thermal coupling and stray capacitance in a composite NTD germanium bolometer, in which previous experimental data at high $V_{\rm bias}$ resulted in oscillations of the impulse response of the detector to irradiation by alpha particles. The model reproduces the transient oscillations seen in the experimental data, depending both on electro-thermal coupling and stray capacitance. This is intended as an experimental and simulated example of such oscillations, demonstrated for the specific case of this bolometric detector.
