论文标题

聚-3-己基噻吩水门薄膜晶体管的长期电特性

Long-term electrical characteristics of a poly-3-hexylthiophene water-gated thin-film transistor

论文作者

Luukkonen, Axel, Tewari, Amit, Björkström, Kim, Ghafari, Amir Mohammad, Österbacka, Ronald, Macchia, Eleonora, Torricelli, Fabrizio, Torsi, Luisa

论文摘要

有机水门控薄膜晶体管(WG-TFTS)在开发低成本和高性能的生物传感器方面具有极大的兴趣。该设备对测量条件变化的敏感性可能会损害长期操作,并且必须注意确保WG-TFT传感器响应是由于传感电极上发生的实际生物识别事件引起的。这项工作旨在阐明在5750测量周期内,多-3-己基噻吩(P3HT)WG-TFT在两个月内间歇性地运行的长期稳定性。我们已经评估了整个测量周期内评估了功绩(FOM)的设备数字,例如阈值电压,迁移率和陷阱密度。 FOM的短期变化主要归因于门电极的工作函数变化,而长期变化与半导体陷阱密度的增加一致。发现阈值电压的变化和迁移率的降低是线性的,这是测量周期的函数,并由电应力引起,而时间浸入水中对设备的影响可忽略不计。使用亚阈值坡度估计的陷阱密度与P3HT OFET的早期报道的值相似,并且在设备使用过程中表现出逐渐增加和休息后的部分恢复,这表明形成了较短的和长期寿命的陷阱。

Organic water-gated thin-film transistors (WG-TFTs) are of great interest in developing low-cost and high-performance biosensors. The device's sensitivity to changes in measurement conditions can impair long-term operation, and care must be taken to ensure that the WG-TFT sensor response is due to an actual biorecognition event occurring on the sensing electrode. This work aims to clarify the long-term stability of a poly-3-hexylthiophene (P3HT) WG-TFT operated intermittently over two months during 5750 measurement cycles. We have evaluated the device figures of merit (FOM), such as threshold voltage, mobility, and trap density, during the whole measurement period. Short-term changes in the FOM are mainly attributed to work function changes on the gate electrode, whereas long-term changes are consistent with an increase in the semiconductor trap density. The shift in threshold voltage and decrease in mobility are found to be linear as a function of measurement cycles and caused by electrical stress, with time immersed in water having a negligible effect on the device. The trap density-of-states estimated using the subthreshold slope is similar to earlier reported values for P3HT OFETs and exhibits a gradual increase during device use and a partial recovery after rest, indicating the formation of shorter- and longer-lived traps.

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