带有内部$^{37} $ ar源的Xenon1t的低能校准

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带有内部$^{37} $ ar源的Xenon1t的低能校准

Low-energy Calibration of XENON1T with an Internal $^{37}$Ar Source

论文作者

Aprile, E., Abe, K., Agostini, F., Maouloud, S. Ahmed, Alfonsi, M., Althueser, L., Andrieu, B., Angelino, E., Angevaare, J. R., Antochi, V. C., Martin, D. Antón, Arneodo, F., Baudis, L., Baxter, A. L., Bellagamba, L., Biondi, R., Bismark, A., Brown, A., Bruenner, S., Bruno, G., Budnik, R., Bui, T. K., Cai, C., Capelli, C., Cardoso, J. M. R., Cichon, D., Colijn, A. P., Conrad, J., Cuenca-García, J. J., Cussonneau, J. P., D'Andrea, V., Decowski, M. P., Di Gangi, P., Di Pede, S., Diglio, S., Eitel, K., Elykov, A., Farrell, S., Ferella, A. D., Ferrari, C., Fischer, H., Fulgione, W., Gaemers, P., Gaior, R., Rosso, A. Gallo, Galloway, M., Gao, F., Glade-Beucke, R., Grandi, L., Grigat, J., Guida, M., Hammann, R., Higuera, A., Hils, C., Hoetzsch, L., Howlett, J., Iacovacci, M., Itow, Y., Jakob, J., Joerg, F., Joy, A., Kato, N., Kara, M., Kavrigin, P., Kazama, S., Kobayashi, M., Koltman, G., Kopec, A., Kuger, F., Landsman, H., Lang, R. F., Levinson, L., Li, I., Li, S., Liang, S., Lindemann, S., Lindner, M., Liu, K., Loizeau, J., Lombardi, F., Long, J., Lopes, J. A. M., Ma, Y., Macolino, C., Mahlstedt, J., Mancuso, A., Manenti, L., Marignetti, F., Undagoitia, T. Marrodán, Martens, K., Masbou, J., Masson, D., Masson, E., Mastroianni, S., Messina, M., Miuchi, K., Mizukoshi, K., Molinario, A., Moriyama, S., Morå, K., Mosbacher, Y., Murra, M., Müller, J., Ni, K., Oberlack, U., Paetsch, B., Palacio, J., Peres, R., Peters, C., Pienaar, J., Pierre, M., Pizzella, V., Plante, G., Qi, J., Qin, J., García, D. Ramírez, Reichard, S., Rocchetti, A., Rupp, N., Sanchez, L., Sanchez-Lucas, P., Santos, J. M. F. dos, Sarnoff, I., Sartorelli, G., Schreiner, J., Schulte, D., Schulte, P., Eißing, H. Schulze, Schumann, M., Lavina, L. Scotto, Selvi, M., Semeria, F., Shagin, P., Shi, S., Shockley, E., Silva, M., Simgen, H., Takeda, A., Tan, P. -L., Terliuk, A., Thers, D., Toschi, F., Trinchero, G., Tunnell, C., Tönnies, F., Valerius, K., Volta, G., Weinheimer, C., Weiss, M., Wenz, D., Wittweg, C., Wolf, T., Xu, D., Xu, Z., Yamashita, M., Yang, L., Ye, J., Yuan, L., Zavattini, G., Zerbo, S., Zhong, M., Zhu, T., Geppert, C., Riemer, J.

论文摘要

对内部$^{37} $ ar源的Xenon1t的低能电子后线校准，这是一种双相氙时间投影室。该校准源具有35天的半衰期，并在2.82 KEV和0.27 KEV的情况下提供两条单能线。在2.82 keV处的光子产率和电子产率分别为（32.3 $ \ pm $ 0.3）光子/keV和（40.6 $ \ pm $ 0.5）电子/keV，与其他测量和巢预测一致。还测量了0.27 keV的电子收益率，它是（68.0 $^{+6.3} _ { - 3.7} $）电子/kev。 $^{37} $ ar校准证实了检测器在接近检测阈值的能量区域中被很好地理解，而2.82 KEV线重建为（2.83 $ \ pm $ 0.02）KEV，该模型进一步验证了用于解释低增强电子后退的模型先前报道了先前由Xenon1t报道的低功能电子退缩。校准后，用低温蒸馏有效去除氩气的能力证明$^{37} $ ar可以将其视为多吨XENON检测器的常规校准源。

A low-energy electronic recoil calibration of XENON1T, a dual-phase xenon time projection chamber, with an internal $^{37}$Ar source was performed. This calibration source features a 35-day half-life and provides two mono-energetic lines at 2.82 keV and 0.27 keV. The photon yield and electron yield at 2.82 keV are measured to be (32.3$\pm$0.3) photons/keV and (40.6$\pm$0.5) electrons/keV, respectively, in agreement with other measurements and with NEST predictions. The electron yield at 0.27 keV is also measured and it is (68.0$^{+6.3}_{-3.7}$) electrons/keV. The $^{37}$Ar calibration confirms that the detector is well-understood in the energy region close to the detection threshold, with the 2.82 keV line reconstructed at (2.83$\pm$0.02) keV, which further validates the model used to interpret the low-energy electronic recoil excess previously reported by XENON1T. The ability to efficiently remove argon with cryogenic distillation after the calibration proves that $^{37}$Ar can be considered as a regular calibration source for multi-tonne xenon detectors.

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